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Also offered as: CHEM 5304
Grading Basis: Graded
Lecture on sample preparation and analyses for surfaces and interfaces, including scanning Auger microscopy, secondary ion mass spectrometry, X-ray photoelectron spectroscopy, contact angle measurements, and temperature program methods.
Last Refreshed: 08-DEC-23 05.20.22.289867 AM
|Section||Class Number||Notes||Instructor||Enrollment||Term||Session||Instruction Mode|
|1233 9523 1 001||001||9523||Suib, Steven